MCP Detectors for Counting and Time Resolved Imaging, Delay-Line Anodes, Multi-hit Solutions, Time of Flight Applications, Delay Line Detectors
Time of Flight Electron Microscopes, k-ToF-PEEM with Hexapod Specimen Manipulator, LHe cooling, Imaging Spin Filter Option
Ultrafast Detector Electronics, Time to Digital Converters, Constant Fraction Discriminators, High Voltage Supplies
Fast.
Our imaging detector systems achieve continuous random count rates of 2-25 MHz (depending on the particular detector layout).
Flexible.
Key features as in-vacuum layouts and flange sizes can be modified to meet your requirements.
Plug'n Play.
Plug'n play detector readout via USB 3.0 or Ethernet and a stand-alone live monitor DLD-software ensure ease of use. Program examples for Python available.
News, Events, & Announcements
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k-ToF Momentum Microscopes
With Imaging Spin Filter Option
New Product, click for more (PDF): Sophisticated Time-of-Flight Momentum Microscope and Imaging Spin DetectorsBased on developments of Prof. Dr. Gerd Schönhense (University Mainz),
Prof. Dr. Jürgen Kirschner (formerly Max Planck Institute Halle), Dr. Christian Tusche (FZ Jülich)
Development breakthrough for MultiLine Delay Line Detector Technology
ML-DLDs enable several ten MultiHits, first 2D images now! Click for more (PDF)
Large neutron detectors
based on NOVA Scientific’s unique neutron-sensitive NeuView(TM) MCPs provide <100 ns time resolution.
300 keV Electron Detector
(TEM-DLD) STEM strain measurements with nano-beam electron diffraction
Performance improvement
for all 3D-DLDsWith the latest generation of 3D delay line detectors we have enhanced linearity, lateral and temporal resolution.
Stand-Alone Time Measurement System with Highest Precision
Measurements were performed with SC-TDC-1000/04 D in "burst operation". Time resolutions better than 25ps achieved! More (PDF)
»»» more news »»»
Info, Projects, Collaborations
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TORR SCIENTIFIC (UK) and SURFACE CONCEPT: A new strategic partnership for tool developments and component distribution
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Visit our North American sales partner
- 300 keV Electron Detector (DLD) for STEM strain measurements
- Guidelines for Position and Time Sensitive Imaging
- Survey of Particle MCP Detectors with Delay Line Anode
- High Precision High Voltage Supplies